LEG35162 doc. no : qw0905-LEG35162 rev. : a date : 16 - feb - 2005 data sheet ligitek electronics co.,ltd. property of ligitek only bipolar type led lamps
25.0min 0.5 typ note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation -60 x 50% 75% 100% 0 25% 25% 100% 50% 75% 60 x -30 x 0 x 30 x 2.54typ 1.0min 1 2 1 2 part no. LEG35162 package dimensions page 1/5 7.01 1.76 1.5max e g 1.7 1.75 3.95 ligitek electronics co.,ltd. property of ligitek only
storage temperature tstg -40c ~ +100 c j viewing angle 2 c 1/2 (deg) peak wave length f pnm 635 565 note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. green gap gaasp/gap LEG35162 orange white diffused emitted lens 50 8.0 4.5 2.6 30 1.7 3.0 2.6 30 1.7 min. min. max. 50 5.0 typ. typical electrical & optical characteristics (ta=25 j ) material part no color luminous intensity @10ma(mcd) spectral halfwidth ??f nm forward voltage @20ma(v) soldering temperature tsol max 260 j for 5 sec max (2mm from body) operating temperature reverse current @5v t opr ir peak forward current duty 1/10@10khz power dissipation pd i fp -40 c ~ +85 c 10 j g a 100 120 mw ma absolute maximum ratings at ta=25 j absolute maximum ratings forward current parameter i f symbol e g 30 ma unit ligitek electronics co.,ltd. property of ligitek only part no. LEG35162 page 2/5 30 120 100 10
1.0 relative intensity@20ma 0.0 0.5 wavelength (nm) 550 600 650 ambient temperature( j ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature forward voltage@20ma normalize @25 j -20 -40 0.8 1.0 0.9 1.1 1.2 0.5 relative intensity@20ma normalize @25 j -20 ambient temperature( j ) 80 60 40 20 0-40 100 0.0 80 60 02040 100 fig.4 relative intensity vs. temperature 2.5 1.5 1.0 2.0 3.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 forward current(ma) 0.1 1.0 10 1.0 1000 e chip relative intensity normalize @20ma 0.5 forward voltage(v) 2.0 3.0 4.0 5.0 1.0 0.0 1.5 1.0 2.0 2.5 forward current(ma) 10 100 1000 fig.2 relative intensity vs. forward current 3.0 ligitek electronics co.,ltd. property of ligitek only 700 750 part no. LEG35162 3/5 page
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 500 550 600 650 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 3.5 g chip part no. LEG35162 4/5 page
mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. solder resistance test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test this test intended to see soldering well performed or not. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec thermal shock test high temperature high humidity test 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hous. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs mil-std-202:103b jis c 7021: b-11 part no. LEG35162 page 5/5 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. high temperature storage test low temperature storage test operating life test 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 reference standard ligitek electronics co.,ltd. property of ligitek only
|
